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Chapter 8: Theory of Operation
Self-Tests Descriptions
verified that each register has been initialized. Test patterns are then written to
ensure the chip address lines are not shorted or opened. Finally test data is
written to registers of individual acquisition ICs to ensure each acquisition IC can
be selected independently.
Passing the Register Test implies that the acquisition IC registers can store
acquisition control data to properly manage the operating of each IC.
Memory Test. The Memory Test verifies that each bit in the acquisition memory
IC can be written with a logic “0” and logic “1” through the Serial Access Memory
port. Test data is generated using a shifting test register in the acquisition ICs.
the serialized test patterns are then sent to the memory port of each acquisition
memory IC and stored. The data in the acquisition memory ICs are then
downloaded and compared with known values.
Passing the Memory Test implies the acquisition memory can store data written
through the memory port. This test along with the Memory Modes Test provides
complete testing of the memory ICs.
Comparator Test. The Comparator Test ensures the data signal comparators in
the module front end can be set to their maximum and minimum thresholds and
that they recognize activity at the signal inputs. A clock signal is routed to a test
port on each comparator. The threshold is then set to the minimum value. The
comparator output is then read and compared with a known value. The threshold
is then set to a maximum value. The comparator output is again read and
compared with a known value.
Passing the Comparators Test implies that the front-end comparators are
operating properly, can recognize both a logic “0” and logic “1”, and can properly
send the acquisition data downstream to the acquisition ICs.
Trigger Bus Test. The Trigger Bus Test verifies the trigger resource lines that
run between each acquisition IC. The test ensures that the trigger resource lines
can be both driven as outputs and read as inputs. The resource registers are
written with test patterns, read back from a different acquisition IC, then
compared with known values.
Trigger Arm Test. The Trigger Arm Test verifies that the local arm signal can be
received by the master acquisition IC on the acquisition board. The test also
verifies the global arm signal can be driven by each acquisition IC on a master
board and received by all acquisition ICs on the card. The arm lines are asserted
and read at the acquisition ICs to ensure each acquisition IC recognized the
signal.
Passing the Trigger Arm Test implies any acquisition IC can arm the card and that
all acquisition ICs can recognize the arm signal.
Clock Paths Test. The Clock Paths Tests verifies that the system Master, Slave,
and Psyn clocks are functional between the acquisitions ICs. The module us