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2635A
Users Manual
2
DC operation, 1-13
DC power, 1-17
Decoding the ascii string, C-1
dedicated alarm output test, 7-18
Digital I/O, 1-18
digital I/O connections, 1-18
Digital input test, 7-16
Digital output test, 7-15
—E—
Example, C-7
Examples, 2-23
External trigger, 2-31
External trigger input, 1-17
external trigger input test, 7-21
—F—
Floating point conversion, C-4
four-terminal resistance test, 7-10
front panel controls, 1-19
front panel indicators, 1-19
front panel operation, 1-7
—H—
how the instrument processes input, 4-12
how the instrument processes output, 4-13
hydra logger package, 1-10
hydra starter package, 1-10
Hysteresis, A-14
—I—
initializing a memory card, 3-7
input channels, 1-13
Input debouncing, A-14
input string examples, 4-13
input terminators, 4-12
Input voltage, A-14
inserting a memory card, 3-5
inserting and removing the memory card, 3-5
installing or replacing the memory card
battery, 3-5
Instrument event register (IER), 4-14
Isolation, A-14
—L—
line fuse, 7-3
—M—
Maximum autoranging time, A-14
measurement capabilities, 1-9
Memory card as a data destination, 2-26
memory card battery, 3-5
memory card capacity, 3-4
Memory card capacity, 2-26
Memory card data extraction, 2-27
Memory card exchange during scanning, 2-26
memory card file operations to and
from a pc, 3-16
Memory card files, 2-26
Memory card formatting, 2-26
memory card operation, 1-7
memory card reader, 1-10
modem operation, 1-8
Monitor-alarm trigger, 2-31
Mx+B scaling, 1-9
—O—
open thermocouple response test, 7-11
operating modes, 1-5, 2-26
options and accessories, 1-10
—P—
performance tests, 7-4
printer operation, 1-8
printing measurement data and memory card
directory, 5-6
printing measurement results during
scanning, 5-6
printing the directory of the memory card, 5-9
printing the review array, 5-8
—R—
Rate, A-14
recording measurement results during
scanning,3-8
removing a memory card, 3-5
Resistance temperature detectors
restrictions:, 2-13
Resistance-temperature detectors, 2-13
Restrictions, 2-8, 2-9, 2-10, 2-11, 2-12, 2-23
RTD temperature accuracy test, 7-13
RTD temperature accuracy test (using decade
resistance source), 7-13
RTD temperature accuracy test (using DIN/IEC
751 RTD), 7-14
—S—
selecting a channel, 2-8
selftest diagnostics and error codes, 7-4
sending numeric values to the instrument, 4-13
Sensitivity, A-12
service, 7-22
setting the memory card write-protect
feature, 3-5
setting the Mx+B scaling, 2-23