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Chapter 5: Troubleshooting
To troubleshoot the acquisition system
5–54
B
FISO failed
When this test fails, run the Extended Service test for the A to D Converter. If any of the channels
pass the extended service A to D Converter test, you can swap an A to D hybrid from a known
good channel to a suspected failing channel to verify the problem, or simply replace the failing
A to D hybrid with a new hybrid.
C
Probe Board failed
Replace the Probe Power and Control assembly.
D Offset DAC failed
Either an Attentuator Assembly failure or Acquisition Assembly failure can cause this test to fail.
If the Offset DAC test fails, first attempt to correct the failure by swapping in known good
attenuator assemblies and then running the Offset DAC Service Extension. If the Offset DAC
test continues to fail, exchange the acquisition assembly, which includes attenuator assemblies.
Before you replace the acquisition assembly with a factory rebuilt exchange assembly, record
the contact closure information for each channel onto the labels attached to each attenuator.
Agilent Technologies uses this to determine when to replace the attenuators to insure quality of
future exchange assemblies.
E
Temperature Sense failed
Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly
wi th a fa ctory r ebuil t exch ange a ssemb ly, re cord the con tact c losur e info rmati on for e ach c hannel
onto the labels attached to each attenuator. Agilent Technologies uses this to determine when
to replace the attenuators to insure quality of future exchange assemblies.
F
Trigger level failed
Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly
wi th a fa ctory r ebuil t exch ange a ssemb ly, re cord the con tact c losur e info rmati on for e ach c hannel
onto the labels attached to each attenuator. Agilent Technologies uses this to determine when
to replace the attenuators to insure quality of future exchange assemblies.
G
Logic Level failed
Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly
wi th a fa ctory r ebuil t exch ange a ssemb ly, re cord the con tact c losur e info rmati on for e ach c hannel
onto the labels attached to each attenuator. Agilent Technologies uses this to determine when
to replace the attenuators to insure quality of future exchange assemblies.
H
Pattern Trigger failed
Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly
wi th a fa ctory r ebuil t exch ange a ssemb ly, re cord the con tact c losur e info rmati on for e ach c hannel
onto the labels attached to each attenuator. Agilent Technologies uses this to determine when
to replace the attenuators to insure quality of future exchange assemblies.
I
State Trigger failed
Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly
wi th a fa ctory r ebuil t exch ange a ssemb ly, re cord the con tact c losur e info rmati on for e ach c hannel
onto the labels attached to each attenuator. Agilent Technologies uses this to determine when
to replace the attenuators to insure quality of future exchange assemblies.
J
Time Tag failed
Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly
wi th a fa ctory r ebuil t exch ange a ssemb ly, re cord the con tact c losur e info rmati on for e ach c hannel
onto the labels attached to each attenuator. Agilent Technologies uses this to determine when
to replace the attenuators to insure quality of future exchange assemblies.