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Table of Contents
3-1 INTRODUCTION
...................
3-3
3-2 RECOMMENDED TEST EQUIPMENT .......3-3
3-3 TEST RECORDS ...................3-3
3-4 CONNECTOR AND KEY LABEL NOTATION . . . 3-3
3-5 682XXB/683XXB POWER LEVELS .........3-6
3-6 INTERNAL TIME BASE AGING RATE TEST . . . 3-8
Test Setup ....................3-9
Test Procedure..................3-9
EXAMPLE:...................3-10
3-7 FREQUENCY SYNTHESIS TESTS ........3-11
Test Setup
...................
3-11
Coarse Loop/YIG Loop Test Procedure
......
3-12
Fine Loop Test Procedure
............
3-13
3-8 SPURIOUS SIGNALS TEST
............
3-14
Test Setup
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3-14
0.01 - 2 GHz Test Procedure
..........
3-14
0.5 - 2.2 GHz Test Procedure
..........
3-17
3-9 HARMONIC TEST: 2 TO 20 GHz
..........
3-18
Test Setup
...................
3-18
Test Procedure (2 to 10 GHz)
..........
3-19
Test Procedure (11 to 20 GHz)
.........
3-20
3-10 SINGLE SIDEBAND PHASE NOISE TEST
....
3-22
Test Setup
...................
3-22
Test Procedure
.................
3-23
Chapter 3
Performance Verification