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Performance Tests
4-20
AWG510 & AWG520 Service Manual
AWG510 & AWG520 Test Record (Page 2 of 4)
Pulse response tests Low limit Test result High limit
CH1
1 V amplit de
Rise time 1.5 ns
1V
amp
lit
u
d
e
Aberration
-7 % +7 %
Flatness (after 50 ns) -3 % +3 %
CH1
2 V amplit de
Rise time 2.5 ns
2V
amp
lit
u
d
e
Aberration
-10 % +10 %
Flatness (after 50 ns) -3 % +3 %
CH2 or CH1
1 V amplit de
Rise time 1.5 ns
1V
amp
lit
u
d
e
Aberration
-7% +7 %
Flatness (after 50 ns) -3 % +3 %
CH2 or CH1
2 V amplit de
Rise time 2.5 ns
2V
amp
lit
u
d
e
Aberration -10 % +10 %
Flatness (after 50 ns) -3 % +3 %
Sine wave tests Low limit Test result High limit
CH1 Harmonics level 0 Hz - 400 MHz -50 dBc
CH1 Noise level 0 Hz - 400 MHz -53 dBc
CH2 Harmonics level 0 Hz - 400 MHz -50 dBc
CH2 Noise level 0 Hz - 400 MHz -53 dBc
Trigger input tests Low limit Test result High limit
Trigger level accuracy
5V 4.65 V 5.35 V
-5 V -5.35 V -4.65 V
10MHz reference input tests Low limit Test result High limit
Clock output frequency
10.0 MHz reference 49,990 kHz 50,010 kHz
10.1 MHz reference 50,490 kHz 50,510 kHz