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© National Instruments Corporation 51 NI PXI-5422 Calibration Procedure
g. Call niFgen_Commit (niFgen Commit VI) to commit the
attribute values to the device using the following parameter:
• vi: The session handle returned from
niFgen_InitExtCal
h. Wait 500 ms for the output to settle.
i. Use the DMM to measure the voltage output by the device. This
measurement is
measurement 1, which is used in step 12.
j. Call
niFgen_WriteBinary16AnalogStaticValue (niFgen
Write Binary 16 Analog Static Value VI) to set the main DAC
value using the following parameters:
• vi: The session handle returned from
niFgen_InitExtCal
• channelName:
"0"
• value: –32767
k. Call niFgen_SetAttributeViInt32 to set the gain DAC value
(niFgen property node: Calibration»Gain DAC Value) using the
following parameters:
• vi: The session handle returned from
niFgen_InitExtCal
• channelName: "0"
• attributeID: NIFGEN_ATTR_GAIN_DAC_VALUE
• value: 1500
l. Call niFgen_Commit (niFgen Commit VI) to commit the
attribute values to the device using the following parameter:
• vi: The session handle returned from
niFgen_InitExtCal
m. Wait 500 ms for the output to settle.
n. Use the DMM to measure the voltage output by the device. This
measurement is
measurement 2, which is used in step 12.
o. Call
niFgen_SetAttributeViInt32 to set the gain DAC value
(niFgen property node: Calibration»Gain DAC Value) using the
following parameters:
• vi: The session handle returned from
niFgen_InitExtCal
• channelName: "0"
• attributeID: NIFGEN_ATTR_GAIN_DAC_VALUE
• value: 2300
p. Call niFgen_Commit (niFgen Commit VI) to commit the
attribute values to the device using the following parameter:
• vi: The session handle returned from
niFgen_InitExtCal
q. Wait 500 ms for the output to settle.
r. Use the DMM to measure the voltage output by the device. This
measurement is
measurement 3, which is used in step 12.