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A-20 682XXB/683XXB MM
TEST MODEL
RECORD 68245B/68345B
3-7 Frequency Synthesis Tests
Coarse Loop/YIG Loop Test Procedure Fine Loop Test Procedure (Standard 68X45B)
Test Frequency (in GHz) Measured Value * Test Frequency (in GHz) Measured Value **
1.000 000 000
2.000 000 000
3.000 000 000
4.000 000 000
5.000 000 000
6.000 000 000
7.000 000 000
8.000 000 000
9.000 000 000
10.000 000 000
11.000 000 000
12.000 000 000
13.000 000 000
14.000 000 000
15.000 000 000
16.000 000 000
17.000 000 000
18.000 000 000
19.000 000 000
20.000 000 000
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1.000 001 000
1.000 002 000
1.000 003 000
1.000 004 000
1.000 005 000
1.000 006 000
1.000 007 000
1.000 008 000
1.000 009 000
1.000 010 000
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** Specifications for all frequencies listed above is 100 Hz
Fine Loop Test Procedure (68X45B with Option 11)
Test Frequency (in GHz) Measured Value ***
1.000 000 100
1.000 000 200
1.000 000 300
1.000 000 400
1.000 000 500
1.000 000 600
1.000 000 700
1.000 000 800
1.000 000 900
1.000 001 000
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* Specification for all frequencies listed above is 100 Hz.
*** Specification for all frequencies listed above is 10 Hz.