Glossary
© National Instruments Corporation G-15 NI 5102 User Manual
R
RAM random-access memory
real time a property of an event or system in which data is processed as it is acquired
instead of being accumulated and processed at a later time
record length the amount of memory dedicated to storing digitized samples for
postscripting or display. In a digitizer, this limits the maximum duration of
a single-shot acquisition
referenced signal
sources
signal sources with voltage signals that are referenced to a system ground,
such as the earth or a building ground. Also called grounded signal sources
referenced
single-ended
measurement system
all measurements are made with respect to a common reference
measurement system or a ground. Also called a grounded measurement
system
relative accuracy a measure in LSB of the accuracy of an ADC. It includes all nonlinearity
and quantization errors. It does not include offset and gain errors of the
circuitry feeding the ADC
resolution the smallest signal increment that can be detected by a measurement
system. Resolution can be expressed in bits, in proportions, or in percent
of full scale. For example, a system has 12-bit resolution, one part in
4,096 resolution, and 0.0244 percent of full scale
R
in
input resistance
RIS random-interleaved sampling
RIS GAIN the range of values that TDC can return; the maximum TDC value minus
the minimum TDC value
RIS OFFSET the minimum value that the TDC can return
rise time the difference in time between the 10% and 90% points of a system’s
step response
rms root mean square—a measure of signal amplitude; the square root of the
average value of the square of the instantaneous signal amplitude
ROM read-only memory
